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Integration of Large-Chamber Scanning Electron Microscopy and Image-Stitching Techniques to Characterize Full-Sized Components

Published online by Cambridge University Press:  31 July 2006

JJ Frafjord ,
S Dekanich ,
A Mathews III ,
T Savage ,
C Kammerud ,
B Abidi ,
D Page  and
M Abidi
JJ Frafjord
Affiliation:
Y-12 National Security Complex
S Dekanich
Affiliation:
Y-12 National Security Complex
A Mathews III
Affiliation:
Y-12 National Security Complex
T Savage
Affiliation:
Y-12 National Security Complex
C Kammerud
Affiliation:
University of Tennessee
B Abidi
Affiliation:
University of Tennessee
D Page
Affiliation:
University of Tennessee
M Abidi
Affiliation:
University of Tennessee
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 80 - 81
Copyright
© 2006 Microscopy Society of America

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