In-situ Transmission Electron Microscopy at pressures above 1 bar and elevated temperatures

H. Zandbergen

doi:10.1017/S1431927612007428

In-situ Transmission Electron Microscopy at pressures above 1 bar and elevated temperatures

Published online by Cambridge University Press: 23 November 2012

H. Zandbergen

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H. Zandbergen*: Affiliation:
Kavli Centre of NanoScience Delft University of Technology, Delft, Netherlands

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type: Research Article
Information: Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1114 - 1115

DOI: https://doi.org/10.1017/S1431927612007428 [Opens in a new window]

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In-situ Transmission Electron Microscopy at pressures above 1 bar and elevated temperatures

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