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In-situ TEM on interfacial phase transition during shear-mediated grain boundary migration

Published online by Cambridge University Press:  30 July 2021

Zhengwu Fang  and
Scott Mao
Zhengwu Fang
Affiliation:
University of Pittsburgh, United States
Scott Mao
Affiliation:
University of Pittsburgh, United States

Abstract

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Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2402 - 2403
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Schuh, C. A., Kumar, M. & King, W. E. Analysis of grain boundary networks and their evolution during grain boundary engineering. Acta Materialia 51, 687-700, (2003).CrossRefGoogle Scholar
Cantwell, P. R., et al. Grain boundary complexions. Acta Materialia 62, 1-48, (2014).CrossRefGoogle Scholar
Brown, J. A. & Mishin, Y. Dissociation and faceting of asymmetrical tilt grain boundaries: Molecular dynamics simulations of copper. Physical Review B 76, (2007)CrossRefGoogle Scholar