Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-23T16:24:36.944Z Has data issue: false hasContentIssue false

In-situ TEM imaging of Novel Edge Reconstruction in Bilayer Phosphorene

Published online by Cambridge University Press:  22 July 2022

Sol Lee
Affiliation:
Department of Physics, Yonsei University, Seoul, Korea Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Korea
Yangjin Lee
Affiliation:
Department of Physics, Yonsei University, Seoul, Korea Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Korea
Li Ping Ding
Affiliation:
Department of Optoelectronic Science & Technology, School of Electronic Information and Artificial Intelligence, Shaanxi University of Science & Technology, Xi'an, China Center for Multidimensional Carbon Materials, Institute for Basic Science (IBS), Ulsan, Korea
Kihyun Lee
Affiliation:
Department of Physics, Yonsei University, Seoul, Korea
Feng Ding
Affiliation:
Center for Multidimensional Carbon Materials, Institute for Basic Science (IBS), Ulsan, Korea Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan, Korea
Kwanpyo Kim
Affiliation:
Department of Physics, Yonsei University, Seoul, Korea Center for Nanomedicine, Institute for Basic Science (IBS), Seoul, Korea

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Insights into Phase Transitions in Functional Materials by In Situ/Operando TEM: Experiment Meets Theory
Copyright
Copyright © Microscopy Society of America 2022

References

Lee, Y., et al. Nano Lett. 20, 559-566 (2020).CrossRefGoogle Scholar
He, K., et al. ACS Nano. 9, 5, 4786-4795 (2015).CrossRefGoogle Scholar
The authors acknowledge funding from the Basic Science Research Program through the National Research Foundation of Korea (NRF) (NRF-2017R1A5A1014862, NRF-2022R1A2C4002559, NRF-2021R1C1C2006785), and the Institute for Basic Science (IBS-R026-D1).Google Scholar