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In-situ Switching of a Ferroelectric Film Through a Non-ferroelectric Layer and Direct Scanning Probe Analysis of the Same Cross Section

Published online by Cambridge University Press:  27 August 2014

J.R. Jokisaari ,
P. Gao  and
X.Q. Pan
J.R. Jokisaari
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109
P. Gao
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109
X.Q. Pan
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1658 - 1659
Copyright
Copyright © Microscopy Society of America 2014