In-situ Straining Analysis by TEM Orientation Mapping (EBSD-like TEM) - Direct Imaging of Deformation Processes in Nanocrystalline Metals

C. Kuebel; A. Kobler; H. Hahn

doi:10.1017/S1431927612005478

In-situ Straining Analysis by TEM Orientation Mapping (EBSD-like TEM) - Direct Imaging of Deformation Processes in Nanocrystalline Metals

Published online by Cambridge University Press: 23 November 2012

C. Kuebel ,

A. Kobler and

H. Hahn

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C. Kuebel: Affiliation:
INT, KIT, Eggenstein-Leopoldshafen, Germany
A. Kobler: Affiliation:
INT, KIT, Eggenstein-Leopoldshafen, Germany
H. Hahn: Affiliation:
INT, KIT, Eggenstein-Leopoldshafen, Germany

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type: Research Article
Information: Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 724 - 725

DOI: https://doi.org/10.1017/S1431927612005478 [Opens in a new window]

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In-situ Straining Analysis by TEM Orientation Mapping (EBSD-like TEM) - Direct Imaging of Deformation Processes in Nanocrystalline Metals

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