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In-situ Observation of Catalytic Reaction in Gas Atmosphere Using an Aberration Corrected STEM

Published online by Cambridge University Press:  05 August 2019

Manabu Shirai
Affiliation:
Science System Design Division, Hitachi High-Technologies Corporation, Hitachinaka, Ibaraki, Japan
Akinari Hanawa
Affiliation:
Science System Design Division, Hitachi High-Technologies Corporation, Hitachinaka, Ibaraki, Japan
Hideki Kikuchi
Affiliation:
Science System Design Division, Hitachi High-Technologies Corporation, Hitachinaka, Ibaraki, Japan
Hiromi Inada
Affiliation:
Science Systems Sales & Marketing Division, Hitachi High-Technologies, Nishishinbashi, Tokyo, Japan
Hiroaki Matsumoto
Affiliation:
Electron Microscope & AFM Systems Sales Department, China Business Operations, Hitachi High-Technologies Beijing Branch, Chao Yang District, Beijing, China

Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Matsumoto, H. et al. , Microscopy and Analysis 27(7) (2013) 11.Google Scholar
[2]Matsumoto, H. et al. , Microsc. Microanal. 27 (2013) 11.Google Scholar
[3]The authors acknowledge to Prof. S. Miao of Dalian Institute of Chemical Physics Chinese Academy of Sciences for providing the catalyst samples and giving his fruitful comments.Google Scholar