Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-06-28T15:57:02.336Z Has data issue: false hasContentIssue false

In-situ multi-modal microscopy using finely focused ion and electron beams

Published online by Cambridge University Press:  30 July 2021

Tom Wirtz
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Olivier De Castro
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Luxembourg
Jean-Nicolas Audinot
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Luxembourg
Tatjana Taubitz
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Luxembourg
Antje Biesemeier
Affiliation:
Luxembourg Institute of Science and Technology (LIST), Belvaux, Not Applicable, Luxembourg

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Multi-Modal Multi-Dimensional Microscopy
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

This project has received funding from the European Union's Horizon 2020 Research and Innovation Programme under grant agreement No. 720964Google Scholar
Serralta, E., Klingner, N., De Castro, O., Mousley, M., Eswara, S., Duarte Pinto, S., Wirtz, T., Hlawacek, G., Beilstein J. Nanotechnol. 11 (2020) 1854-1864CrossRefGoogle Scholar
Wirtz, T., Philipp, P., Audinot, J.-N., Dowsett, D., Eswara, S., Nanotechnology 26 (2015) 434001CrossRefGoogle Scholar
Eswara, S., Pshenova, A., Yedra, L., Hoang, Q. H., Lovric, J., Philipp, P., Wirtz, T., Appl. Phys. Revs 6 (2019) 021312CrossRefGoogle Scholar
Dowsett, D., Wirtz, T., Anal. Chem. 89 (2017) 8957CrossRefGoogle Scholar
Wirtz, T., De Castro, O., Audinot, J.-N., Philipp, P., Ann. Rev. Anal. Chem. 12 (2019)CrossRefGoogle Scholar