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In-Situ Mass Thickness Calibrations Using MWCNTs

Published online by Cambridge University Press:  05 August 2019

M. Malac ,
D. Homeniuk ,
M. Hayashida ,
T. Fujii ,
T. Yaguchi  and
R.F. Egerton
M. Malac
Affiliation:
NRC-NANO, Edmonton, Canada. Department of Physics, University of Alberta, Edmonton, Canada.
D. Homeniuk
Affiliation:
NRC-NANO, Edmonton, Canada.
M. Hayashida
Affiliation:
NRC-NANO, Edmonton, Canada.
T. Fujii
Affiliation:
Hitachi High-Technologies Corp., Hitachinaka-shi, Ibaraki-ken, Japan.
T. Yaguchi
Affiliation:
Hitachi High-Technologies Corp., Hitachinaka-shi, Ibaraki-ken, Japan.
R.F. Egerton
Affiliation:
Department of Physics, University of Alberta, Edmonton, Canada.

Abstract

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Type
Microscopy and Microanalysis for Real-World Problem Solving
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 792 - 793
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Fujii, T et al. , Microscopy and Microanalysis 24, p. 1612.Google Scholar
[2]Zhang, H-R et al. , Micron 43, p. 8.Google Scholar
[3]Reimer, L, Kohl, H, Transmission Electron Microscopy 5th ed., Springer, 2008.Google Scholar
[4]We acknowledge Dr. Francisco Paraguay Delgado, CIMAV, Mexico, for kindly providing the MWCNT sample.Google Scholar