Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-26T13:39:25.040Z Has data issue: false hasContentIssue false
  • English
  • Français

In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials

Published online by Cambridge University Press:  01 August 2002

B.W. Kempshall  and
L.A. Giannuzzi
B.W. Kempshall
Affiliation:
Mechanical Materials and Aerospace Engineering, University of Central Florida, 4000 Central Florida Blvd, Orlando, FL 32816-2450
L.A. Giannuzzi
Affiliation:
Mechanical Materials and Aerospace Engineering, University of Central Florida, 4000 Central Florida Blvd, Orlando, FL 32816-2450

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 390 - 391
Copyright
Copyright © Microscopy Society of America 2002