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In-situ Fracture Toughness of Single Crystal Silicon Double-Cantilever Beams
Published online by Cambridge University Press: 22 July 2022
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- Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
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- Copyright
- Copyright © Microscopy Society of America 2022
References
This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA-0003525 SAND2022-2060 AGoogle Scholar
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