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In-situ Electrical Transport Measurements Combined with Scanning Transmission X-ray Microscopy

Published online by Cambridge University Press:  10 August 2018

S. Finizio ,
K. Zeissler ,
G. Burnell ,
C.H. Marrows  and
J. Raabe
S. Finizio*
Affiliation:
Swiss Light Source, Paul Scherrer Institut, 5232Villigen PSI, Switzerland
K. Zeissler
Affiliation:
School of Physics and Astronomy, University of Leeds, LeedsLS2 9JT, United Kingdom
G. Burnell
Affiliation:
School of Physics and Astronomy, University of Leeds, LeedsLS2 9JT, United Kingdom
C.H. Marrows
Affiliation:
School of Physics and Astronomy, University of Leeds, LeedsLS2 9JT, United Kingdom
J. Raabe
Affiliation:
Swiss Light Source, Paul Scherrer Institut, 5232Villigen PSI, Switzerland
*
* Corresponding author, [email protected]

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 76 - 77
Copyright
© Microscopy Society of America 2018 

References

[1] Fert, A., et al, Nature Nanotechnology 8, 152 2013.CrossRefGoogle Scholar
[2] Nagaosa, N. Tokura, Y. Nature Nanotechnology 8, 899 2013.CrossRefGoogle Scholar
[3] Zeissler, K., et alarXiv:1706.06024 (2017).Google Scholar
[4] Maccariello, D., et al., Nature Nanotechnology 10.1038/s41565-017-0044-4 2018.Google Scholar
[5] The authors acknowledge funding from the EU Horizon 2020 MAGicSky project (Grant No. 665095).Google Scholar