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In-situ biasing and temperature influence on the electric fields across GaAs based p-n junction via 4D STEM

Published online by Cambridge University Press:  30 July 2021

Anuj Pokle ,
Damien Heimes ,
Andreas Beyer  and
Kerstin Volz
Anuj Pokle
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Marburg, Hessen, Germany
Damien Heimes
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany
Andreas Beyer
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany
Kerstin Volz
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany

Abstract

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Type
New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2238 - 2239
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Shibata, N. et al. Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy. Sci Rep 5, (2015).Google Scholar
McCartney, M. R., Dunin-Borkowski, R. E. & Smith, D. J. Quantitative measurement of nanoscale electrostatic potentials and charges using off-axis electron holography: Developments and opportunities. Ultramicroscopy 203, 105–118 (2019).CrossRefGoogle ScholarPubMed
Twitchett, A. C., Dunin-Borkowski, R. E. & Midgley, P. A. Quantitative Electron Holography of Biased Semiconductor Devices. PHYSICAL REVIEW LETTERS 88, 4 (2002).Google ScholarPubMed
Anada, S. et al. Precise measurement of electric potential, field, and charge density profiles across a biased GaAs p-n tunnel junction by in situ phase-shifting electron holography. Journal of Applied Physics 122, 225702 (2017).CrossRefGoogle Scholar
Beyer, A. et al. Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM. Nano Lett. (2021) doi:10.1021/acs.nanolett.0c04544.CrossRefGoogle ScholarPubMed