Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-30T03:44:13.586Z Has data issue: false hasContentIssue false
  • English
  • Français

In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope

Published online by Cambridge University Press:  05 August 2019

Toshiaki Tanigaki ,
Tetsuya Akashi ,
Takaho Yoshida ,
Ken Harada ,
Kazuo Ishizuka ,
Masahiko Ichimura ,
Yasukazu Murakami ,
Kazutaka Mitsuishi ,
Yasuhide Tomioka  and
Daisuke Shindo
...Show all authors
Toshiaki Tanigaki*
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan.
Tetsuya Akashi
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan.
Takaho Yoshida
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan.
Ken Harada
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan.
Kazuo Ishizuka
Affiliation:
HREM Research Inc., Matsukazedai, Japan.
Masahiko Ichimura
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan.
Yasukazu Murakami
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan. Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka, Japan.
Kazutaka Mitsuishi
Affiliation:
National Institute for Materials Science, Tsukuba, Japan.
Yasuhide Tomioka
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan.
Daisuke Shindo
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan.
Xiuzhen Yu
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan.
Yoshinori Tokura
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan. Department of Applied Physics, The University of Tokyo, Tokyo, Japan.
Hiroyuki Shinada
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan.
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 54 - 55
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Akashi, T. et al. , Appl. Phys. Lett. 106 (2015), p. 074101.Google Scholar
[2]Tanigaki, T. et al. , Adv. Imaging Electron Phys. 198 (2016), p. 69.Google Scholar
[3]Tanigaki, T. et al. , Sci. Rep. 7 (2017), p. 16598.Google Scholar
[4]Tomioka, Y. et al. , Phys. Rev. B 61 (2000) p. 442.Google Scholar
[5]Takai, Y. et al. , J. Electron Microsc. 47 (1998) p. 419.Google Scholar
[6]Development of the 1.2-MV holography electron microscope was supported by a grant from the Japan Society for the Promotion of Science (JSPS) through the “Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST Program)” initiated by the Council for Science, Technology, and Innovation (CSTI). Part of this research was supported by JST CREST Grant Number JPMJCR1664, Japan.Google Scholar