Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-26T13:41:28.456Z Has data issue: false hasContentIssue false
  • English
  • Français

In-operando soft X-ray microspectroscopy of organic electronics devices

Published online by Cambridge University Press:  10 August 2018

Rainer H. Fink ,
Benedikt Rosner ,
Xiaoyan Du ,
Andreas Spam ,
Manuel Johnson ,
Tim Hawly ,
Benjamin Watts ,
Jorg Raabe ,
Luca Gregoratti  and
Matteo Amati
Rainer H. Fink
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany CENEM, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany
Benedikt Rosner
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany present address: LMN, Paul Scherrer Institut, Villigen, Switzerland
Xiaoyan Du
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany present address: i-MEET, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany
Andreas Spam
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany
Manuel Johnson
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany
Tim Hawly
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany
Benjamin Watts
Affiliation:
Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland
Jorg Raabe
Affiliation:
Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland
Luca Gregoratti
Affiliation:
Elettra-Sincrotrone Trieste, Area Science Park, Trieste, Italy
Matteo Amati
Affiliation:
Elettra-Sincrotrone Trieste, Area Science Park, Trieste, Italy

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 424 - 425
Copyright
© Microscopy Society of America 2018 

References

Reference:

[1] Halik, M., et al, Adv. Mater. 15 2003 917.CrossRefGoogle Scholar
[2] Witte, G. Woll, C. J. Mater. Res. 19 2004 1889.Google Scholar
[3] Tello, M., et al, Adv. Funct. Mater. 18 2008 3907.CrossRefGoogle Scholar
[4] Rosner, B., et al, Organic Electronics 15 2014 435.Google Scholar
[5] Xu, C., et al, Angew. Chem. (Int. Ed). 55 2016 9519.Google Scholar
[6] Nakamura, M., et al, App. Phys. Lett. 86 2005 122112.Google Scholar
[7] The authors gratefully acknowledge funding by the German Minister of Education and Research (BMBF, contract 05 K16 WED) and the Deutsche Forschungsgemeinschaft within GRK 1896. X.D. obtained additional support through the China Scholarship Council (CSC). We would like to thank Dr. N. Pillet for experimental support.Google Scholar