Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-17T18:19:15.605Z Has data issue: false hasContentIssue false
  • English
  • Français

Initial Operation of the NanoMAX Beamline at MAX IV

Published online by Cambridge University Press:  10 August 2018

U. Johansson ,
D. Carbone ,
S. Kalbfleisch ,
A. Bjorling ,
A. Rodriguez-Frenandez ,
T. Stankevic ,
M. Liebi ,
B. Bring ,
A. Mikkelsen  and
U. Vogt
U. Johansson*
Affiliation:
MAX IV Laboratory, Lund University, Lund, Sweden
D. Carbone
Affiliation:
MAX IV Laboratory, Lund University, Lund, Sweden
S. Kalbfleisch
Affiliation:
MAX IV Laboratory, Lund University, Lund, Sweden
A. Bjorling
Affiliation:
MAX IV Laboratory, Lund University, Lund, Sweden
A. Rodriguez-Frenandez
Affiliation:
MAX IV Laboratory, Lund University, Lund, Sweden
T. Stankevic
Affiliation:
MAX IV Laboratory, Lund University, Lund, Sweden
M. Liebi
Affiliation:
MAX IV Laboratory, Lund University, Lund, Sweden
B. Bring
Affiliation:
MAX IV Laboratory, Lund University, Lund, Sweden
A. Mikkelsen
Affiliation:
Synchrotron Radiation Research, Department of Physics, Lund University, Lund, Sweden
U. Vogt
Affiliation:
Biomedical & X-Ray Physics, Dept. of Appl. Physics, KTH Royal Inst. of Tech., Stockholm, Sweden
*
* Corresponding author, [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 250 - 251
Copyright
© Microscopy Society of America 2018 

References

[1] Tavares, P F, et al, J. Synchrotron Rad. 21 2014) p. 862.CrossRefGoogle Scholar
[2] Johansson, U, Vogt, U Mikkelsen, A Proc. SPIE 8851 2013) p. 0L.Google Scholar
[3] Yamauchi, K, et al, Rev. Sci. Instrum. 73 2002) p. 4028.CrossRefGoogle Scholar
[4] Parfeniukas, K, et al, Microelectron. Eng. 152 2016) p. 6.CrossRefGoogle Scholar
[5] Akan, R, et al, RCS Adv 8 2018) p. 12628.Google Scholar
[6] Enders, B Thibault Proc, P R. Soc. A 2016 472 p. 0640.Google Scholar
[7] Vogt, U, et al, Proc. SPIE 10389 2017) p. 0K.Google Scholar
[8] The authors acknowledge funding of the NanoMAX beamline by the Knut & Alice Wallenberg Foundation and twelve Swedish universities.Google Scholar