Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-27T02:25:25.211Z Has data issue: false hasContentIssue false

Influence of Co Underlayer Thickness on Mass Resolving Power in Field Evaporated Cu/Co Bilayer

Published online by Cambridge University Press:  09 October 2013

K. Tippey
Affiliation:
B.C. Hornbuckle
Affiliation:
B. Fu
Affiliation:
G.B. Thompson
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013