Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-20T12:27:52.228Z Has data issue: false hasContentIssue false
  • English
  • Français

In SituHigh-Resolution Electron Spectroscopic Imaging and Real-Time Image Simulation of Precipitate Growth Mechanisms

Published online by Cambridge University Press:  02 July 2020

J. M. Howe ,
M. M. Tsai  and
A. A. Csontos
J. M. Howe
Affiliation:
Department of Materials Science & Engineering, University of Virginia, Charlottesville, VA22903
M. M. Tsai
Affiliation:
Department of Materials Science & Engineering, University of Virginia, Charlottesville, VA22903
A. A. Csontos
Affiliation:
Department of Materials Science & Engineering, University of Virginia, Charlottesville, VA22903
Get access

Extract

Precipitate interfaces are ideal for studying the relationship between atomic bonding, structure and composition at internal interfaces and the mechanisms and kinetics of their motion as a function of temperature or driving force for reaction. The crystallography between coherent and semicoherent precipitates and the matrix is well-defined and the precipitate interfaces are often planar and grow by a terrace-ledge-kink mechanism, making them well-suited for study by conventional and high-resolution transmission electron microscopy (HRTEM).

Motion of precipitate interfaces, or more generally, interphase boundaries, involves a change in lattice, composition or both. In order to understand the mechansims of interfacial motion, it is necessary to determine the structural and compositional changes that occur at the highest possible resolution, i.e., as close to the atomic level as possible, and also, to determine the corresponding kinetics of interface motion. HRTEM is an excellent technique for determining the atomic structure of transformation interfaces and in situhot-stage HRTEM is deal for determining interface dynamics at the atomic level, provided the transformation mechanisms are not altered by the thinness of the TEM foil.

Type
Atomic Structure and Mechanisms at Interfaces In Materials
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 627 - 628
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Howe, J. M., Interfaces in Materials: Atomic Structure, Kinetics and Thermodynamics of Solid-Vapor, Solid-Liquid and Solid-Solid Interfaces, New York:John Wiley, & Sons (1997)297.Google Scholar
Shiflet, G. J., Mater. Sci. Eng., 81(1986)61.10.1016/0025-5416(86)90254-5CrossRefGoogle Scholar
Sinclair, R.et al., Eds., Mater. Res. Soc. Symp. Proc. Vol. 183, Pittsburgh:MRS (1990).Google Scholar
Howe, J. M. and Benson, W. E., Interface Science, 2(1995)347.10.1007/BF00222623CrossRefGoogle Scholar
Csontos, A. A., Tsai, M. M. and Howe, J. M., Micron, submitted.Google Scholar
Tsai, M. M., unpublished research (1997).10.1155/S107379289700007XGoogle Scholar
Kilaas, R., in Proc. 45th Ann. Mtg. E.M.SA., San Francisco:San Francisco Press (1987)66.Google Scholar
This research was supported by the National Science Foundation under Grant DMR-9630092.Google Scholar