Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-26T13:09:40.885Z Has data issue: false hasContentIssue false
  • English
  • Français

In situ TEM Observations of Thermally Activated Phenomena in Materials Under Far-From-Equilibrium Conditions

Published online by Cambridge University Press:  22 July 2022

Sriram Vijayan ,
Kaustubh Bawane ,
Fidelma Giulia Dilemma ,
Lingfeng He ,
Carolin Fink  and
Joerg R Jinschek
Sriram Vijayan*
Affiliation:
Department of Materials Science & Engineering, The Ohio State University, Columbus, Ohio, USA
Kaustubh Bawane
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, USA
Fidelma Giulia Dilemma
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, USA
Lingfeng He
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, USA
Carolin Fink
Affiliation:
Department of Materials Science & Engineering, The Ohio State University, Columbus, Ohio, USA
Joerg R Jinschek
Affiliation:
National Center for Nano Fabrication and Characterization (DTU Nanolab), Technical University of Denmark (DTU), Kgs. Lyngby, Denmark
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In Situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1844 - 1846
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Vijayan, S, PhD Theses, 2018, University of Connecticut.Google Scholar
Vijayan, S et al. , J. Mater. Sci. 54 (2019), p. 9921.CrossRefGoogle Scholar
Leonard, H et al. , Mater. Charact. 178 (2021), p. 111239.CrossRefGoogle Scholar
Vijayan, S and Aindow, M, Ultramicroscopy 196 (2019), p. 142.CrossRefGoogle Scholar
Vijayan, S et al. , Microsc. Res. Techn. (2021) p. 1.Google Scholar
Vijayan, S et al. , Microsc. & Microanal., 23 (2017), p. 708.CrossRefGoogle Scholar
Young, GA et al. , Welding Journal 87 (2008), p. 31.Google Scholar
Hofman, GL et al. , J. Nucl. Mater., 227 (1996), p. 277.CrossRefGoogle Scholar
Shao, M et al. , Mater. & Des., 196 (2020), p. 109165.CrossRefGoogle Scholar
The authors acknowledge funding from Office of Naval Research (ONR), MURI grant 102359, and by the LDRD program at Idaho National Laboratory (INL)Google Scholar