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The in situ Studies on the Anomalous Domain Switching Caused by Trace Amount of Oxygen Vacancies
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[6]The electron microscopy work was carried out at Brookhaven National Laboratory and supported by the U.S. DOE Basic Energy Sciences, Materials Sciences and Engineering Division under Contract No. DESC0012704.Google Scholar
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