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In Situ STEM of Ag and Cu Conducting Bridge Formation through Al2O3 in Nanoscale Resistive Memory Devices

Published online by Cambridge University Press:  27 August 2014

William A. Hubbard ,
E. R. White ,
Alexander Kerelsky ,
Jared J. Lodico  and
B. C. Regan
William A. Hubbard
Affiliation:
1Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
E. R. White
Affiliation:
1Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
Alexander Kerelsky
Affiliation:
1Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
Jared J. Lodico
Affiliation:
1Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
B. C. Regan
Affiliation:
1Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1550 - 1551
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Yang, J., et al, Nature Nanotechnology 8 (2013), 13-24.Google Scholar
[2] Rahaman, S, et al, Nanoscale Research Letters 7 (2012) 345.Google Scholar
[3] Valov, I., et al, Nature Communications 4 (2013) 1771.Google Scholar
[4] This work is supported by STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, NSF DMR award 1206849, and the Electron Imaging Center for NanoMachines at the UCLA CNSI.Google Scholar