Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-06T08:23:02.387Z Has data issue: false hasContentIssue false
  • English
  • Français

In Situ Electron Microscopy Characterization of Optoelectronic Nanostructures and Nanodevices

Published online by Cambridge University Press:  01 August 2010

M Gao ,
C Li ,
W Li ,
Z Liu  and
L-M Peng
M Gao
Affiliation:
Peking University, China
C Li
Affiliation:
Peking University, China
W Li
Affiliation:
Peking University, China
Z Liu
Affiliation:
Peking University, China
L-M Peng
Affiliation:
Peking University, China

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1758 - 1759
Copyright
Copyright © Microscopy Society of America 2010