Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-23T14:13:37.057Z Has data issue: false hasContentIssue false

In situ Cryogenic STEM of Correlated Electronic Materials

Published online by Cambridge University Press:  22 July 2022

Ismail El Baggari
Affiliation:
The Rowland Institute at Harvard, Cambridge, MA, USA
Patrick Singleton
Affiliation:
The Rowland Institute at Harvard, Cambridge, MA, USA Department of Physics, Harvard University, Cambridge, MA, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Insights into Phase Transitions in Functional Materials by In Situ/Operando TEM: Experiment Meets Theory
Copyright
Copyright © Microscopy Society of America 2022

References

Gao, P et al. , Nature Communications 2, 1 (2011)10.1038/ncomms1600CrossRefGoogle Scholar
El Baggari, I et al. , Proceedings of the National Academy of Sciences 115, 7 (2018)Google Scholar
El Baggari, I et al. , Physical Review Letters 125, 16 (2020)10.1103/PhysRevLett.125.165302CrossRefGoogle Scholar
Mune, J et al. , Nano Letters 21, 20 (2021)Google Scholar
Salmani-Rezaie, S et al. , Physical Review Letters 125, 8 (2020)10.1103/PhysRevLett.125.087601CrossRefGoogle Scholar
Zhao, W. et al. , Science Advances 4, 3 (2018): eaao2682Google Scholar
El Baggari, I et al. , Nature Communications 12, 1 (2021)10.1038/s41467-021-24026-7CrossRefGoogle Scholar
Goodge, B et al. , Microscopy and Microanalysis 26, 3 (2020)Google Scholar
Tyukalova, E et al. , Accounts of Chemical Research 54, 16 (2021)10.1021/acs.accounts.1c00078CrossRefGoogle Scholar
The authors acknowledge primary support from the Rowland Institute at Harvard. This work made use of facilities at the Harvard Center for Nanoscale Systems which is supported by the National Science Foundation.Google Scholar