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In Situ Analytical Electron Microscopy and Cryogenic Electron Microscopy for Characterizing Nanoscale Materials in Electrochemical Process
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[2]Poizot, P., Laruelle, S., Grugeon, S., Dupont, L. and Tarascon, J., Nature 407 (2000), 496-499.Google Scholar
[4]Cheng, X.-B., Zhang, R., Zhao, C.-Z., Wei, F., and Zhang, J.-G., Advanced Science 3 (3) (2016), 1500213.Google Scholar
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[7]We are grateful for financial support from the Assistant Secretary for Energy Efficiency and Renewable Energy, Office of Vehicle Technologies of the U.S. Department of Energy under the Battery500 Consortium. This research was also sponsored by the Materials Sciences and Engineering Division of the U.S. Department of Energy (DOE), Office of Basic Energy Sciences (BES), and was performed at the Center for Nanophase Materials Sciences (CNMS) at Oak Ridge National Laboratory (ORNL), which is a DOE Office of Science User Facility.Google Scholar
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