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In situ 4D-STEM Imaging to Develop a Fundamental Understanding of Coupled Transport of Vacancies

Published online by Cambridge University Press:  22 July 2022

Sean H. Mills ,
Steven E. Zeltmann ,
Peter Ercius ,
Aaron Kohnert ,
Blas Uberuaga  and
Andrew M. Minor
Sean H. Mills*
Affiliation:
Materials Science and Engineering, University of California at Berkeley, Berkeley, CA, USA National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Steven E. Zeltmann
Affiliation:
Materials Science and Engineering, University of California at Berkeley, Berkeley, CA, USA
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Aaron Kohnert
Affiliation:
Materials Science and Technology, Los Alamos National Laboratory, Los Alamos, NM, USA
Blas Uberuaga
Affiliation:
Materials Science and Technology, Los Alamos National Laboratory, Los Alamos, NM, USA
Andrew M. Minor
Affiliation:
Materials Science and Engineering, University of California at Berkeley, Berkeley, CA, USA National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2114 - 2115
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Copyright
Copyright © Microscopy Society of America 2022

References

Simmons, R O and Balluffi, RW, Physical Review 125 (1962), p. 862.Google Scholar
West, R, Positrons in Solids (1979), p. 89.Google Scholar
Ophus, C, Microscopy and Microanalysis 25 (2019), p. 563.Google Scholar
Kraftmakher, Y, Physics Reports 299 (1998), p. 79.10.1016/S0370-1573(97)00082-3CrossRefGoogle Scholar
Pamato, MG et al. , Journal of Applied Crystallography 51 (2018), p. 470.10.1107/S1600576718002248CrossRefGoogle Scholar
Primary support for this work came from FUTURE (Fundamental Understanding of Transport Under Reactor Extremes), an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Basic Energy Sciences. SEZ was supported by STROBE: A National Science Foundation Science and Technology Center under Grant No. DMR 1548924. The authors acknowledge support by the Molecular Foundry at Lawrence Berkeley National Laboratory, which is supported by the U.S. Department of Energy under Contract No. DE-AC02-05-CH11231.Google Scholar