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Improving the Sensitivity and Efficiency of FRET Measurements Using Lock-In and Spectral Detection

Published online by Cambridge University Press:  23 November 2012

D.W. Piston ,
R.K. Benninger ,
A.D. Elliott ,
L. Gao  and
T. Tkaczyk
D.W. Piston
Affiliation:
2215 Garland Ave, Vanderbilt University, Nashville, TN
R.K. Benninger
Affiliation:
2215 Garland Ave, Vanderbilt University, Nashville, TN
A.D. Elliott
Affiliation:
2215 Garland Ave, Vanderbilt University, Nashville, TN
L. Gao
Affiliation:
Rice University, Houston, TX
T. Tkaczyk
Affiliation:
Rice University, Houston, TX
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 138 - 139
Copyright
Copyright © Microscopy Society of America 2012

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