Hostname: page-component-7bb8b95d7b-w7rtg Total loading time: 0 Render date: 2024-10-06T10:54:41.261Z Has data issue: false hasContentIssue false
  • English
  • Français

Improving the Noise Floor and Speed of Your Detector: A Modular Hardware Approach for Under $1000

Published online by Cambridge University Press:  22 July 2022

Jonathan J. P. Peters ,
Tiarnan Mullarkey  and
Lewys Jones
Jonathan J. P. Peters*
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland
Tiarnan Mullarkey
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland Centre for Doctoral Training in the Advanced Characterisation of Materials, AMBER Centre, Dublin, Ireland
Lewys Jones
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland Centre for Doctoral Training in the Advanced Characterisation of Materials, AMBER Centre, Dublin, Ireland Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures & Nanodevices (CRANN), Dublin
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Microscopy Infrastructures: Architectures, Avenues and Access
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2904 - 2906
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Van Aert, S., Verbeeck, J., Erni, R., Bals, S., Luysberg, M., Van Dyck, D., Van Tendeloo, G., Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy, Ultramicroscopy. 109 (2009) 1236–1244.CrossRefGoogle ScholarPubMed
De Wael, A., De Backer, A., Jones, L., Varambhia, A., Nellist, P.D., Van Aert, S., Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy, Phys. Rev. Lett. 124 (2020) 106105.CrossRefGoogle ScholarPubMed
MacArthur, K.E., Jones, L.B., Nellist, P.D., How flat is your detector? Non-uniform annular detector sensitivity in STEM quantification, J. Phys. Conf. Ser. 522 (2014) 012018.CrossRefGoogle Scholar
Seifer, S., Houben, L., Elbaum, M., Flexible STEM with Simultaneous Phase and Depth Contrast, Microsc. Microanal. (2021) 1–12.Google ScholarPubMed
Mullarkey, T., Downing, C., Jones, L., Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM, Microsc. Microanal. 27 (2021) 99–108.CrossRefGoogle ScholarPubMed
Mittelberger, A., Kramberger, C., Meyer, J.C., Software electron counting for low-dose scanning transmission electron microscopy, Ultramicroscopy. 188 (2018) 1–7.CrossRefGoogle ScholarPubMed
The authors would like to acknowledge the Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and the Advanced Materials and BioEngineering Research (AMBER) Network for financial and infrastructural support for this work. L.J. is supported by SFI award number URF/RI/191637. J.J.P.P. and L.J. acknowledge SFI grant 19/FFP/6813, T.M. acknowledges the SFI-EPSRC CDT-ACM (grants 18/EPSRC-CDT-3581 and EP/S023259/1).Google Scholar