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Improving 4DSTEM measurements of atomic charge and electrostatic potential via energy filtration

Published online by Cambridge University Press:  30 July 2021

Thomas Pekin ,
Marcel Schloz ,
Benedikt Haas ,
Wouter Van den Broek  and
Christoph Koch
Thomas Pekin
Affiliation:
Humboldt Universität zu Berlin, United States
Marcel Schloz
Affiliation:
Humboldt Universität zu Berlin, United States
Benedikt Haas
Affiliation:
Department of Physics, Humboldt University of Berlin, Berlin, Germany, United States
Wouter Van den Broek
Affiliation:
Humboldt Universität zu Berlin, Berlin, Berlin, United States
Christoph Koch
Affiliation:
Department of Physics, Humboldt University of Berlin, Berlin, Germany, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1450 - 1452
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Rodenburg, John M. "Ptychography and related diffractive imaging methods." Advances in imaging and electron physics 150 (2008): 87–184.Google Scholar
Jiang, Yi, et al. "Electron ptychography of 2D materials to deep sub-ångström resolution." Nature 559.7714 (2018): 343–349.CrossRefGoogle Scholar
Yang, H., et al. "Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures." Nature Communications 7.1 (2016): 1–8.Google ScholarPubMed
Hachtel, Jordan A., Idrobo, Juan Carlos, and Chi, Miaofang. "Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope." Advanced Structural and Chemical Imaging 4.1 (2018): 1–10.CrossRefGoogle Scholar
Schloz, Marcel, et al. "Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimization." Optics Express 28.19 (2020): 28306–28323.CrossRefGoogle ScholarPubMed
Chen, Zhen, et al. "Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose." Nature Communications 11.1 (2020): 1–10.Google ScholarPubMed
Li, Peng, and Maiden, Andrew. "Multi-slice ptychographic tomography." Scientific Reports 8.1 (2018): 1–10.Google ScholarPubMed