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Improvements of Elemental Mapping via X-ray Spectrum Imaging Combined with Principal Component Analysis and Zero-Peak Deconvolution

Published online by Cambridge University Press:  01 August 2004

M. Watanabe  and
D.B. Williams
M. Watanabe
Affiliation:
Lehigh University, Bethlehem, Pennsylvania
D.B. Williams
Affiliation:
Lehigh University, Bethlehem, Pennsylvania
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1040 - 1041
Copyright
© 2004 Microscopy Society of America

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