Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-27T02:23:58.612Z Has data issue: false hasContentIssue false
  • English
  • Français

Improvement of Spatial Resolution in Z Direction with Improved Energy Spread Measured using Aberration Corrected STEM with Cold Field Emission Gun

Published online by Cambridge University Press:  05 August 2019

Hiroki Hashiguchi ,
Ryusuke Sagawa ,
Noriaki Endo ,
Eiji Okunishi  and
Yukihito Kondo
Hiroki Hashiguchi*
Affiliation:
JEOL Ltd.3-1-2 Musashino Akishima Tokyo, Japan
Ryusuke Sagawa
Affiliation:
JEOL Ltd.3-1-2 Musashino Akishima Tokyo, Japan
Noriaki Endo
Affiliation:
JEOL Ltd.3-1-2 Musashino Akishima Tokyo, Japan
Eiji Okunishi
Affiliation:
JEOL Ltd.3-1-2 Musashino Akishima Tokyo, Japan
Yukihito Kondo
Affiliation:
JEOL Ltd.3-1-2 Musashino Akishima Tokyo, Japan
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 514 - 515
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Morishita, S et al. , Microscopy 67 (2018), p. 46.Google Scholar
[2]Benthem, K et al. , Ultramicroscopy 106 (2006), p. 1062.Google Scholar