Improved Efficiency Characterisation for Large Solid Angle SDD Detectors

PJ Statham

doi:10.1017/S1431927610058125

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Crossref Citations

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Maniguet, L Robaut, F Meuris, A Roussel-Dherbey, F and Chariot, F 2012. X-ray microanalysis: the state of the art of SDD detectors and WDS systems on scanning electron microscopes (SEM). IOP Conference Series: Materials Science and Engineering, Vol. 32, Issue. , p. 012015.

Hodoroaba, Vasile-Dan and Procop, Mathias 2014. A Method to Test the Performance of an Energy-Dispersive X-Ray Spectrometer (EDS). Microscopy and Microanalysis, Vol. 20, Issue. 5, p. 1556.

Statham, P. J. 2015. Enhanced Theoretical Model for Avoiding Mistakes in SEM-EDS Analysis. Microscopy and Microanalysis, Vol. 21, Issue. S3, p. 1631.

Statham, P. Sagar, J. Holland, J. Manktelow, J. and Lozano-Perez, S. 2016. Mass Thickness Measurement in TEM: A New Single Standard Method for Convenient Quantification by TEM EDS. Microscopy and Microanalysis, Vol. 22, Issue. S3, p. 38.

Statham, P Penman, C and Duncumb, P 2016. Improved spectrum simulation for validating SEM-EDS analysis. IOP Conference Series: Materials Science and Engineering, Vol. 109, Issue. , p. 012016.

Procop, Mathias Hodoroaba, Vasile-Dan Terborg, Ralf and Berger, Dirk 2016. Determination of the Effective Detector Area of an Energy-Dispersive X-Ray Spectrometer at the Scanning Electron Microscope Using Experimental and Theoretical X-Ray Emission Yields. Microscopy and Microanalysis, Vol. 22, Issue. 6, p. 1360.

Statham, P Sagar, J Holland, J Pinard, P and Lozano-Perez, S. 2018. A convenient method for X-ray analysis in TEM that measures mass thickness and composition. IOP Conference Series: Materials Science and Engineering, Vol. 304, Issue. , p. 012017.

Morita, Hirobumi Marks, Sam and Anderson, Iain 2019. The Recent Resolution and Detection Limit Improvement of EDS and EBSD with SEM: Invited Paper. p. 51.

Pinard, P T Protheroe, A Holland, J Burgess, S and Statham, P J 2020. Development and validation of standardless and standards-based X-ray microanalysis. IOP Conference Series: Materials Science and Engineering, Vol. 891, Issue. 1, p. 012020.

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Improved Efficiency Characterisation for Large Solid Angle SDD Detectors

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