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Imaging At the Timescale Of Micro- and Milliseconds With the pnCCD (S)TEM Camera

Published online by Cambridge University Press:  23 September 2015

H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
M. Simson
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
M. Den Hertog
Affiliation:
Institut Neel-CNRS, 25 Rue des Martyrs, 38042 Grenoble, France
R. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre, Peter Grunberg Institute, Forschungszentrum Julich, Leo-Brandt-StraBe, 52425 Juelich, Germany
K. El Hajraoui
Affiliation:
Institut Neel-CNRS, 25 Rue des Martyrs, 38042 Grenoble, France
R. Hartmann
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
M. Huth
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
S. Ihle
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
V. Migunov
Affiliation:
Ernst Ruska-Centre, Peter Grunberg Institute, Forschungszentrum Julich, Leo-Brandt-StraBe, 52425 Juelich, Germany
J. Schmidt
Affiliation:
Institut Neel-CNRS, 25 Rue des Martyrs, 38042 Grenoble, France
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
L. Striider
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Ryll, H., et al, Microscopy and Microanalysis 19 (2013), p 11601161.CrossRefGoogle Scholar
[2] Mongillo, M., et al, ACS Nano 5 (2011), p 71177123.CrossRefGoogle Scholar
[3] Liu, R., et al, Nano Letters 13 (2013), p 29973001.Google Scholar