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Imaging Analytical Studies of Old Master Paints Using FTIR, SIMS and SEMEDX of Embedded Paint Cross Sections

Published online by Cambridge University Press:  01 August 2005

J Boon
Affiliation:
FOM Institute AMOLF, The Netherlands
E S B Ferreira
Affiliation:
FOM Institute AMOLF, The Netherlands
K Keune
Affiliation:
FOM Institute AMOLF, The Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Copyright
© 2005 Microscopy Society of America