Image Simulations of Defect Images in STEM Observation Mode

M De Graef

doi:10.1017/S1431927610054504

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Image Simulations of Defect Images in STEM Observation Mode

Published online by Cambridge University Press: 01 August 2010

M De Graef

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M De Graef: Affiliation:
Carnegie Mellon University

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 246 - 247

DOI: https://doi.org/10.1017/S1431927610054504 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2010

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Image Simulations of Defect Images in STEM Observation Mode

Volume 16, Supplement S2
M De Graef ^(a1)
DOI: https://doi.org/10.1017/S1431927610054504

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Image Simulations of Defect Images in STEM Observation Mode

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