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Image Reconstruction From TEM Diffraction Patterns Using Feinup Algorithm

Published online by Cambridge University Press:  02 July 2020

Q. Chen ,
U. Weierstall  and
J. C. H. Spence
Q. Chen
Affiliation:
Department of Physics & Astronomy, Arizona State University, Tempe, AZ85287-1504.
U. Weierstall
Affiliation:
Department of Physics & Astronomy, Arizona State University, Tempe, AZ85287-1504.
J. C. H. Spence
Affiliation:
Department of Physics & Astronomy, Arizona State University, Tempe, AZ85287-1504.
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Iterative algorithms, which use diffracted intensities and some a-priori knowledge of an image to solve the phase problem, have been under development for many years. The promised super-resolution images, reconstructed from diffraction information alone, would be of the greatest value for molecular imaging and for the image of nonperiodic structures in materials. Using simulated data it is possible, for example, to reconstruct a complex object from a knowledge of its diffracted intensities with certain known support functions. Some success has recently been achieved reconstructing micrometer-sized non-periodic objects using coherent X-rays by the Feinup method. One favorable support function consists of two holes spanned by the coherence width of the beam, with one or both holes containing an unknown object. Our simulations, which iterate between diffracted intensities and the image, applying the known support (either completely opaque or completely transparent) and intensities in each domain, confirm that image reconstruction is possible for loose supports and noiseless data.

Type
Sir John Meurig Thomas Symposium: Microscopy and Microanalysis in the Chemical Sciences
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 34 - 35
Copyright
Copyright © Microscopy Society of America

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