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Image Processing and Lattice Determination for Three-Dimensional Nanocrystals

Published online by Cambridge University Press:  18 November 2011

Linhua Jiang ,
Dilyana Georgieva ,
Igor Nederlof ,
Zunfeng Liu  and
Jan Pieter Abrahams
Linhua Jiang*
Affiliation:
Gorlaeus Laboratory, Faculty of Science, Leiden University, Einsteinweg 55, 2333 CC Leiden, The Netherlands Service Science Research Center, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201203, China
Dilyana Georgieva
Affiliation:
Gorlaeus Laboratory, Faculty of Science, Leiden University, Einsteinweg 55, 2333 CC Leiden, The Netherlands
Igor Nederlof
Affiliation:
Gorlaeus Laboratory, Faculty of Science, Leiden University, Einsteinweg 55, 2333 CC Leiden, The Netherlands
Zunfeng Liu
Affiliation:
Gorlaeus Laboratory, Faculty of Science, Leiden University, Einsteinweg 55, 2333 CC Leiden, The Netherlands
Jan Pieter Abrahams*
Affiliation:
Gorlaeus Laboratory, Faculty of Science, Leiden University, Einsteinweg 55, 2333 CC Leiden, The Netherlands
*
Corresponding author. E-mail: [email protected]
Corresponding author. E-mail: [email protected]
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Abstract

Three-dimensional nanocrystals can be studied by electron diffraction using transmission cryo-electron microscopy. For molecular structure determination of proteins, such nanosized crystalline samples are out of reach for traditional single-crystal X-ray crystallography. For the study of materials that are not sensitive to the electron beam, software has been developed for determining the crystal lattice and orientation parameters. These methods require radiation-hard materials that survive careful orienting of the crystals and measuring diffraction of one and the same crystal from different, but known directions. However, as such methods can only deal with well-oriented crystalline samples, a problem exists for three-dimensional (3D) crystals of proteins and other radiation sensitive materials that do not survive careful rotational alignment in the electron microscope. Here, we discuss our newly released software AMP that can deal with nonoriented diffraction patterns, and we discuss the progress of our new preprocessing program that uses autocorrelation patterns of diffraction images for lattice determination and indexing of 3D nanocrystals.

Keywords

electron diffraction3D nanocrystalsimage processinglattice determinationprotein crystalscryo-EM
Type
Software and Techniques Development
Information
Microscopy and Microanalysis , Volume 17 , Issue 6 , December 2011 , pp. 879 - 885
Copyright
Copyright © Microscopy Society of America 2011

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