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Image Fusion in SIMS-based Correlative Microscopy: Methodology and Applications

Published online by Cambridge University Press:  01 August 2018

Jean-Nicolas Audinot ,
Florian Vollnhals ,
Santhana Eswara  and
Tom Wirtz
Jean-Nicolas Audinot
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
Florian Vollnhals
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
Santhana Eswara
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
Tom Wirtz
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 404 - 405
Copyright
© Microscopy Society of America 2018 

References

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[3] Vollnhals, F., et al, Anal. Chem. 89 2017) p. 10702.Google Scholar
[4] Gratia, P., et al, ACS Energy Lett. 2 2017) p. 2686.Google Scholar