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Identification of Chemical Dopants in YBa2Cu3O7-δ by Electron Probe Microanalyzer

Published online by Cambridge University Press:  01 August 2018

Shayna M. Slicer
Affiliation:
Department of Chemistry and Physics, Fayetteville State University, Fayetteville, North Carolina, USA
Charles Q. Luo
Affiliation:
Department of Chemistry and Physics, Fayetteville State University, Fayetteville, North Carolina, USA
Zhiping Luo
Affiliation:
Department of Chemistry and Physics, Fayetteville State University, Fayetteville, North Carolina, USA
Sharon C. Yeung
Affiliation:
Department of Chemical Engineering, University of Notre Dame, Notre Dame, Indiana, USA
Paul J. McGinn
Affiliation:
Department of Chemical Engineering, University of Notre Dame, Notre Dame, Indiana, USA
Dean J. Miller
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, Illinois, USA TESCAN USA, Warrendale, PA, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

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[4] Khan, M.Z., et al, Physica C 545 2018) p. 50.Google Scholar
[5] Luo, Z. A Practical Guide to Transmission Electron Microscopy (Volume II: Advanced Microscopy Momentum Press New York.Google Scholar
[6] The authors acknowledge funding from the NSF HRD 1436120. The instrumentation at FSU was supported by DoD W911NF-09-1-0011, W911NF-14-1-0060, W911NF-15-1-0566 and NSF MRI Program DMR 1626376..Google Scholar