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Hybrid Detectors for High Resolution Imaging.

Published online by Cambridge University Press:  10 August 2018

A. Bergamaschi ,
M. Andra ,
R. Barten ,
M. Bruckner ,
S. Chiriotti ,
C. David ,
R. Dinapoli ,
E. Frojdh ,
D. Greiffenberg  and
M. Lebugle
...Show all authors
A. Bergamaschi*
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
M. Andra
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
R. Barten
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
M. Bruckner
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
S. Chiriotti
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
C. David
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
R. Dinapoli
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
E. Frojdh
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
D. Greiffenberg
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
M. Lebugle
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
C. Lopez-Cuenca
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
D. Mezza
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
A. Mozzanica
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
M. Ramilli
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
S. Redford
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
C. Ruder
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
B. Schmitt
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
X. Shi
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
D. Thattil
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
G. Tinti
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
S. Vetter
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
J. Zhang
Affiliation:
Paul Scherrer Institut, Villigen PSI, Switzerland.
*
*Corresponding author, [email protected]

Abstract

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Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 316 - 319
Copyright
© Microscopy Society of America 2018 

References

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