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HR-STEM Imaging and EELS Characterizing of Nano-Scale Defects in Sputter Deposited Thin Films of Double-Perovskite Sr2FeMoO6 (SFMO) and Sr2CrReO6 (SCRO)

Published online by Cambridge University Press:  08 April 2017

R Williams ,
A Hauser ,
R Richiardo ,
M Dixit ,
J Lucy ,
P Woodward ,
F Yang  and
H Fraser
R Williams
Affiliation:
Ohio State University
A Hauser
Affiliation:
Ohio State University
R Richiardo
Affiliation:
Ohio State University
M Dixit
Affiliation:
Ohio State University
J Lucy
Affiliation:
Ohio State University
P Woodward
Affiliation:
Ohio State University
F Yang
Affiliation:
Ohio State University
H Fraser
Affiliation:
Ohio State University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1654 - 1655
Copyright
Copyright © Microscopy Society of America 2011