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High-Throughput, Semi-Automated Quantitative STEM Atom Counting in Supported Metal Nanoparticles Using a Conventional TEM/STEM

Published online by Cambridge University Press:  25 July 2016

Stephen D. House ,
Yuxiang Chen ,
Rongchao Jin  and
Judith C. Yang
Stephen D. House
Affiliation:
Dept. of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA(USA)
Yuxiang Chen
Affiliation:
Dept. of Chemistry, Carnegie Mellon University, Pittsburgh, PA(USA)
Rongchao Jin
Affiliation:
Dept. of Chemistry, Carnegie Mellon University, Pittsburgh, PA(USA)
Judith C. Yang
Affiliation:
Dept. of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA(USA)

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 938 - 939
Copyright
© Microscopy Society of America 2016 

References

References:

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[7] This work was supported by DOE BES through grant DE FG02-03ER15476, and performed using the facilities at the Nanoscale Fabrication and Characterization Facility at the University of Pittsburgh. R.J. thanks financial support from the Air Force Office of Scientific Research under AFOSR Award No. FA9550-15-1-9999 (FA9550-15-1-0154) and the Camille Dreyfus Teacher-Scholar Awards Program.Google Scholar