A High-Speed Electron-Counting Direct Detection Camera for TEM

P Mooney; D Contarato; P Denes; A Gubbens; B Lee; M Lent; D Agard

doi:10.1017/S1431927611005897

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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A High-Speed Electron-Counting Direct Detection Camera for TEM

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