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High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

Published online by Cambridge University Press:  09 April 2017

K Dudeck ,
M Couillard ,
N Gauquelin ,
L Gunawan ,
S Hosseini Vajargah ,
S Lazar ,
D Rossouw ,
Y Shao ,
G Zhu  and
G Botton
K Dudeck
Affiliation:
McMaster University, Canada
M Couillard
Affiliation:
McMaster University, Canada
N Gauquelin
Affiliation:
McMaster University, Canada
L Gunawan
Affiliation:
McMaster University, Canada
S Hosseini Vajargah
Affiliation:
McMaster University, Canada
S Lazar
Affiliation:
FEI Electron Optics, The Netherlands
D Rossouw
Affiliation:
McMaster University, Canada
Y Shao
Affiliation:
McMaster University, Canada
G Zhu
Affiliation:
McMaster University, Canada
G Botton
Affiliation:
McMaster University, Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 794 - 795
Copyright
Copyright © Microscopy Society of America 2011