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High-Fidelity 4D-STEM Enabled by Live Processing at 15’000 Detector Frames Per Second

Published online by Cambridge University Press:  30 July 2021

Benedikt Haas
Affiliation:
Department of Physics, Humboldt University of Berlin, Berlin, Germany, United States
Andreas Mittelberger
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, United States
Chris Meyer
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, Washington, United States
Benjamin Plotkin-Swing
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, United States
Niklas Dellby
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, United States
Ondrej Krivanek
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, United States
Tracy Lovejoy
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, 98034, USA, United States
Christoph Koch
Affiliation:
Department of Physics, Humboldt University of Berlin, Berlin, Germany, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Meyer, C., et al. , Microscop. Microanal. 25 (Suppl 2), 122 (2019). https://github.com/nion-software/nionswiftGoogle Scholar
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Acknowledgements: We thank Tobias Schulz from Leibniz Institute for Crystal Growth (IKZ) for providing the SrTiO3 sample.Google Scholar