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High Throughput Quantitative Phase Mapping Using Synchrotron X-Ray Diffraction

Published online by Cambridge University Press:  25 July 2016

Jae-Hyuk Her
Affiliation:
GE Global Research Center, Niskayuna, NY 12309, U.S.A.
Yan Gao
Affiliation:
GE Global Research Center, Niskayuna, NY 12309, U.S.A.
Erik Jezek
Affiliation:
GE Global Research Center, Niskayuna, NY 12309, U.S.A.
Job Rijssenbeek
Affiliation:
GE Global Research Center, Niskayuna, NY 12309, U.S.A.
Zhong
Affiliation:
. Department of Geosciences, Stony Brook University, Stony Brook, NY 11794, U.S.A.
Parise
Affiliation:
. Department of Geosciences, Stony Brook University, Stony Brook, NY 11794, U.S.A.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Rietveld, H.M. J. Appl. Cryst. 22, 6571, 1969.Google Scholar
[2] Bruker Corporation.Google Scholar
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[4] The authors gratefully acknowledge funding support from the New York State Energy Research and Development Authority (NYSERDA) via the New York Battery and Energy Storage Technology Consortium (NY-BEST). NYSERDA has not reviewed the information contained herein, and the opinions expressed in this report do not necessarily reflect those of NYSERDA or the State of New York.Google Scholar
[5] The authors deeply appreciate Dr. K. Chapman’s help in the experiments done in Beamline 11-ID-B, Advanced Photon Source, Argonne National Laboratory. This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. Use of the National Synchrotron Light Source, Brookhaven National Laboratory, was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-98CH10886.Google Scholar