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High Speed, High Resolution Imaging Spectrometers Based on pnCCDs for XRF and XRD Applications

Published online by Cambridge University Press:  25 July 2016

L. Strüder ,
R. Hartmann ,
P. Holl ,
S. Ihle ,
M. Huth ,
J. Schmidt ,
Ch. Thamm ,
B. Kann-gieBer ,
J. Baumann  and
A. Renno
...Show all authors
L. Strüder
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, D-81739 Munich,Germany University of Siegen, Walter-Flex-Str.3, 57072 Siegen, Germany
R. Hartmann
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, D-81739 Munich,Germany
P. Holl
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, D-81739 Munich,Germany
S. Ihle
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 Munich, Germany
M. Huth
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 Munich, Germany
J. Schmidt
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 Munich, Germany
Ch. Thamm
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 Munich, Germany
B. Kann-gieBer
Affiliation:
TU Berlin, Analytical X-Ray Physics , Hardenbergstr. 36, D-10587 Berlin, Germany
J. Baumann
Affiliation:
TU Berlin, Analytical X-Ray Physics , Hardenbergstr. 36, D-10587 Berlin, Germany
A. Renno
Affiliation:
HZDR, Bautzner LandstraBe 400, 01328 Dresden, Germany
J. Grenzer
Affiliation:
HZDR, Bautzner LandstraBe 400, 01328 Dresden, Germany
M. Radtke
Affiliation:
Bundesanstalt fiir Materialpriifung, Richard-Willstaetter-Str. 11, 12489 Berlin, Germany
A. Abboud
Affiliation:
University of Siegen, Walter-Flex-Str.3, 57072 Siegen, Germany
U. Pietsch
Affiliation:
University of Siegen, Walter-Flex-Str.3, 57072 Siegen, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 Munich, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 100 - 101
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Ordavo, I., et al., NIM A 654 (2011) 250–257.Google Scholar
[2] Baumann, J., et al., submitted to Applied Physics Letters (2016).Google Scholar
[3] Novak, S., et al., X-ray Spectrometry 44(3 (2015).Google Scholar
[4] Radtke, M., et al., Microchemical Journal 125 (2016) 56–61.Google Scholar
[5] Abboud, A., et al., Rev. of Sci. Instr. (Volume 85, Issue 11 (2014).CrossRefGoogle Scholar