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High Spatial Resolution Quantification X-ray Microanalysis in a Field Emission Scanning Electron Microscope with an Annular Silicon Drift Detector

Published online by Cambridge University Press:  23 September 2015

Hendrix Demers ,
Nicolas Brodusch ,
Patrick Woo  and
Raynald Gauvin
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Nicolas Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Patrick Woo
Affiliation:
Hitachi High-Technologies Canada Inc., Toronto, Canada.
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2359 - 2360
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Bruker ESPRIT software version 1. 9.Google Scholar
[2] Horny, P., Lifshin, E., Campbell, H. & Gauvin, R., Microscopy and Microanalysis 16 (2010). p. 821–830.CrossRefGoogle Scholar
[3] Gauvin, R., Microscopy and Microanalysis 18 (2012). p. 915–940.CrossRefGoogle Scholar