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High Resolution TEM Observation of Nanocrystalline Silicon Fabricated by High Pressure Torsion (HPT)

Published online by Cambridge University Press:  23 September 2015

Yuta Fukushima ,
Kaveh Edalati ,
Yoshifumi Ikoma ,
Zenji Horita  and
David J. Smith
Yuta Fukushima
Affiliation:
Department of Materials Science & Engineering, Kyushu University, Fukuoka 819-0395, Japan Department of Physics, Arizona State University, Tempe, Arizona 85287, USA
Kaveh Edalati
Affiliation:
Department of Materials Science & Engineering, Kyushu University, Fukuoka 819-0395, Japan WPI, International Institute for Carbon-Neutral Energy Research (WPI-I2CNER), Kyushu University, Fukuoka 819-0395, Japan
Yoshifumi Ikoma
Affiliation:
Department of Materials Science & Engineering, Kyushu University, Fukuoka 819-0395, Japan
Zenji Horita
Affiliation:
Department of Materials Science & Engineering, Kyushu University, Fukuoka 819-0395, Japan WPI, International Institute for Carbon-Neutral Energy Research (WPI-I2CNER), Kyushu University, Fukuoka 819-0395, Japan
David J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, Arizona 85287, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1783 - 1784
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[3] Valiev, R. Z., Korznikov, A.V. & Mulyukov, R. R., Mater. Sci. Eng. A168, 99 (1993).Google Scholar
[4] Ikoma, Y., et al, J. Mater. Sci. 49, 19 (2014).Google Scholar
[5] This work was supported in part by a Grant-in-Aid for Scientific Research from the MEXT Japan, in Innovative Areas "Bulk Nanostructured Metals" (Nos. 22102004, 25102708). The authors gratefully acknowledge use of facilities in the John M. Cowley Center for High Resolution Microscopy at Arizona State University..Google Scholar