Hostname: page-component-848d4c4894-jbqgn Total loading time: 0 Render date: 2024-07-04T23:43:24.152Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution Scanning Transmission Electron Microscopy of Normal and Inverse Spinel Regions in Epitaxially Grown CoFe2O4

Published online by Cambridge University Press:  01 August 2018

Amanda Hanks Trout ,
Igor V. Pinchuk ,
Walid Amamou ,
Robert E. A. Williams ,
Roland K. Kawakami  and
David W. McComb
Amanda Hanks Trout
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH Department of Materials Science and Engineering, The Ohio State University, Columbus, OH
Igor V. Pinchuk
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH
Walid Amamou
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH
Robert E. A. Williams
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH
Roland K. Kawakami
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH
David W. McComb
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH Department of Materials Science and Engineering, The Ohio State University, Columbus, OH

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 70 - 71
Copyright
© Microscopy Society of America 2018 

References

[1] Ferreira, T. A. S., et al, Solid State Sciences 5 2003) p. 383.Google Scholar
[2] Tatarchuk, T. R., et al, Journal of Alloys and Compounds 694 2017) p. 777.Google Scholar
[3] Docherty, F. T., et al, Ultramicroscopy 86 2001) p. 273.Google Scholar
[4] Tileli, V., et al, Nanoscale 7 2015) p. 218.Google Scholar
[5] Amamou, W., et al, Physical Review Materials 2 2018.Google Scholar
[6] Gobbi, G. C., et al, Chemistry Letters 14 1985) p. 771.Google Scholar
[7] Allen, L. J., et al, Ultramicroscopy 151 2015) p. 11.Google Scholar