Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-23T01:02:02.288Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution Observations of Interface Dynamics Using a Direct Electron Detection Camera

Published online by Cambridge University Press:  27 August 2014

T. Radetic ,
A. Gautam ,
C. Ophus ,
C. Czarnik  and
U. Dahmen
T. Radetic
Affiliation:
National Center for Electron Microscopy, LBNL, Berkeley California 94720USA
A. Gautam
Affiliation:
National Center for Electron Microscopy, LBNL, Berkeley California 94720USA
C. Ophus
Affiliation:
National Center for Electron Microscopy, LBNL, Berkeley California 94720USA
C. Czarnik
Affiliation:
Gatan Inc., Pleasanton, California 94588USA
U. Dahmen
Affiliation:
National Center for Electron Microscopy, LBNL, Berkeley California 94720USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1594 - 1595
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Dahmen, U, et al., P. Philos T R Soc A (2009);367:3795.Google Scholar
[2] Merkle, K, Thompson, L, Phillipp, F Interface Sci (2004);12:277.Google Scholar
[3] Trautt, ZT, Upmanyu, M, Karma, A Science (2006);314:632.Google Scholar
[4] Radetic, T, Ophus, C, Olmsted, DL, Asta, M, Dahmen, U Acta Materialia (2012);60:7051.Google Scholar
[5] Johnson, Ε, Prokofjev, S, Zhilin, V, Dahmen, U Z Metallkd (2005);96:1171.Google Scholar
[6] The National Center for Electron Microscopy at LBNL is supported by the U.S. Department of Energy under Contract # DE-AC02-05CH11231.Google Scholar